Conformity issue in ISO 17987-7

In the LIN conformance test plan (ISO 17987-7), there is conflicting description:

  • In Table 41 there is the Parameter 11 (VSUP_NON_OP MIN: -0,3 V and MAX: 40 V) with an additional condition specified (voltage range within which the device is not destroyed. An optional time limit for the maximum value shall be at least 400-ms; no guarantee of correct operation).
  • In Table 10 in ISO 17987-4, this parameter 11 is specified as VSUP_NON_OP MIN: -0,3 V and MAX: 40 V. The condition reads “Voltage range within which the device is not destroyed; no guarantee of correct operation”.
  • In ISO 17987-7, there is a dynamic test specified, in which the IUT (implementation under test) is tested to withstand a 40-V insertion for 30 s without to be destroyed.

The optional 400-ms condition in the conformance test plan was introduced when migrating from LIN 2.2 to the ISO 17987 series. The parameter 11 and parameter 56 is a maximum rating parameter. Background is the load dump pulse, which is a very short event. This is the rational for the ≤400-ms condition. Conformance test houses evaluate this test without the 400-ms condition and ask the IUT manufacturer to delete this condition in their datasheets.

In the LIN conformance test plan (ISO 17987-7), there is conflicting description:

  • In Table 142 there is the Parameter 56 (VSUP_NON_OP MIN: -0,3 V and MAX: 58 V) with an additional condition specified (voltage range within which the device is not destroyed. An optional time limit for the maximum value shall be at least 350-ms; no guarantee of correct operation).
  • In Table 15 in ISO 17987-4, this parameter 56 is specified as VSUP_NON_OP MIN: -0,3 V and MAX: 58 V. The condition reads “Voltage range within which the device is not destroyed; no guarantee of correct operation”.
  • In ISO 17987-7, there is a dynamic test specified, in which the IUT (implementation under test) is tested to withstand a 58 V insertion for 30 s without to be destroyed.

The optional 350-ms condition in the conformance test plan was introduced when migrating from LIN 2.2 to the ISO 17987 series. The parameter 56 is a maximum rating parameter. Background is the load dump pulse, which is a very short event. This is the rational for the ≤350-ms condition. Conformance test houses evaluate this test without the 350-ms condition and ask the IUT manufacturer to delete this condition in their datasheets.